Scanning Electron Microscopy

Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses a focused beam of electrons to create high-resolution images of the surface of a sample. The electron beam scans the surface of the sample, and the electrons that are scattered or emitted from the sample are detected and used to create an image. SEM can provide detailed information about the topography, morphology, and composition of a sample, and is widely used in materials science, biology, and other fields. SEM can also be used to analyze the elemental composition of a sample using energy-dispersive X-ray spectroscopy (EDS), which detects the characteristic X-rays emitted by the sample when it is bombarded with electrons.

Your Previous Searches

Random Picks

Binary Data: Binary data refers to any data or information that is represented in binary form, which is a system of numerical notation that uses only two digits, typically 0 and 1. In the context of data science and artificial intelligence, binary data ... Read More >>
Graphical User Interface: A Graphical User Interface (GUI) is a type of user interface that allows users to interact with electronic devices through graphical elements such as icons, buttons, and windows. GUIs are designed to simplify the use of complex software app ... Read More >>
Data Indexing: Data indexing is the process of organizing and storing data in a way that enables efficient and fast retrieval of specific information. In data science and artificial intelligence, data indexing is a crucial step in data management and anal ... Read More >>

Scanning Electron Microscopy

Your Previous Searches

Random Picks

Top News

Employees were already freaked out about AI — Amazon just proved them right...

Trump’s purges come for the U.S.’ nuclear safety board...

Amazon says it will reduce its workforce as AI replaces human employees | CNN Bu...

Amazon’s Jassy says AI will reduce company’s corporate ranks...

Bank of America is bullish on these 4 under-the-radar AI stocks...